1. #MTDT 2004
پدیدآورنده : #edited by R. Rajsuman and T. Wik , sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council ... and others
کتابخانه: Central Library of Esfehan University of Technology (Esfahan)
موضوع : Semiconductor storage devices- Testing- Congresses ،Random access memory- Congresses
رده :
#
TK
،#.
M4
,
I334
،#
2004
2. Proceedings: International Workshop on Memory Technology, Design, and Testing
پدیدآورنده : / edited by F. Lombardi, R. Rajsuman, and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI; in cooperation with IEEE Solid State Circuits Council
کتابخانه: Central Library and Archive Center of shahid Beheshti University (Tehran)
موضوع : Semiconductor storage devices,Random access memory,-- Testing Congresses,-- Congresses
رده :
621
.
39732
I11P
1997
3. Records of the ... IEEE International Workshop on Memory Technology, Design, and Testing
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Semiconductor storage devices-- Testing-- Congresses,، Random access memory-- Congresses
رده :
TK
7895
.
M4
.
I335
4. Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, 7-8 August 2000, San Jose, California
پدیدآورنده : edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI; in cooperation with IEEE Solid State Circuits Society
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Testing -- Congresses ، Semiconductor storage devices,Congresses ، Random access memory
رده :
TK
7895
.
M4
I334
2000
5. Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
پدیدآورنده : IEEE International Workshop on Memory Technology, Design, and Testing )1994 : San Jose, Calif.(
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Semiconductor storage devices - Testing - Congresses , Random access memory - Congresses
رده :
TK
7895
.
M4
I334
1994
6. Records of the 1999 IEEE International Workshop on memory Technology, Design and Testing, August 9-10, 1999, San Jose, Calif., USA
پدیدآورنده : edited by R. Rajsuman and T. Wik; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology; in cooperation with the IEEE Solid-State Circuits Society
کتابخانه: Library of Institute for Research in Fundamental Sciences (Tehran)
موضوع : Testing -- Congresses ، Semiconductor storage devices,Congresses ، Random access memory
رده :
TK
7895
.
M4I44
1999
